Today, with the growing development of communication and electronic technology, all systems are still composed of various components. A wide variety of components still play a cornerstone in the development of various industries. This role is indispensable and diverse.
In response to today's rich device testing needs and challenges, how to perform device performance identification directly affects the performance and stability of the entire system in the future.
Today we will give you a detailed explanation of the challenges of device testing. Detailed documentation is provided after each feature article, all of which are full of dry goods!
Active device test
Let's talk about the most common active device tests. In this section, the device under test is usually an amplifier, mixer or inverter.
With its high integration and flexible hardware structure, Keysight's popular PNA-B series vector network analyzer can replace the complicated test cabinets by itself, and complete the following complex tests on a single-handed basis. Exist, Keysight senior engineers are very impressed with it, too will be robbed! Some of its killers are as follows:
2. Millimeter wave terahertz device test
Millimeter-wave terahertz device testing is the fastest growing new force in the industry. With the popularity of 5G technology, the widespread use of automotive radar, and the rapid commercialization of advanced technologies such as terahertz imaging, millimeter-wave devices are becoming more widely used. .
The Keysight N5290A/91A broadband single-scan solution supports 900Hz-120GHz frequency coverage, and with the spread spectrum module, it can achieve frequency coverage up to 1.5THz. The most important thing, don't forget the test engine of this system, but the PNA-B vector network analyzer just introduced.
So, even in the millimeter wave and terahertz fields, in addition to its best S-parameter test, it can help engineers complete:
Millimeter wave spectrum analysis
True differential and I/Q device measurements in the millimeter wave frequency range
Multi-channel testing in the millimeter wave range
Millimeter wave band mixer and inverter loss, gain and input and output matching test
3. Wafer testing
Wafer testing also plays a vital role in the hot semiconductor industry. Accurate and repeatable wafer level measurements are essential for device modeling, technology development, semiconductor process development and specification, process control, component calibration and prototyping.
To reduce the amount of time users spend configuring the system, Keysight and Cascade Microtech have established a new unified global service model that provides a comprehensive range of integrated features using Keysight test instruments and test software, Cascade Microtech wafer-level probe stations and accessories. Component measurement and device characterization solutions.
The new service and technical support model established by the solution in the industry, we call it WMS (Wafer-level Measurement Solution Program), can provide guaranteed configuration, security and comprehensive technical support for semiconductor users:
Accurate and repeatable wafer level measurement
Single connection, multiple measurements to ensure wafer yield
Work with Cascade Mirotech to provide users with guaranteed system configuration
The shortest measurement time
4. Passive device testing
Passive devices are widely used in the electronics industry, widely used, and low in cost.
In the decades of rapid growth in manufacturing in China, the truth is that high-reliability, stability and repeatability line testing solutions are the most effective means of cost control.
The industry's flagship and standard ENA economical network analyzer has been proven in large-scale production environments and has become a model for the industry.
For the development of a large number of multi-port devices, complex market environment, changing products, dynamic changes in shipments, everywhere is a challenge. In order to help users respond flexibly, modular vector network analyzers came into being. Key capabilities include:
Typical performance of high reliability
Flexible port number configuration
Flexible testing of test sites
One-time testing of multiport devices
Full cross calibration and measurement up to 32 ports
5. Material testing
With the rapid development of various advanced technologies, material science as a true basic discipline has received more attention in the past two years.
Faced with a wide variety of materials to be tested, from the various materials in the electronics industry, such as commonly used antenna materials, materials in the aviation field, material requirements in the home appliance industry, as small as the fruit maturity and inclusion in our daily lives. The amount of sugar, all of which are inseparable from material testing.
In this field, Keysight will never be soft! The Keysight Network Analyzer and the latest material testing software N1500A will provide you with the most complete material testing capabilities. Be aware that the N1500A is the industry's most authoritative material testing tool!
Automated test function for dielectric constant and magnetic permeability
Flexible configuration measurement methods support transmission line method, arched reflectivity, cavity method, coaxial probe method, free space method, etc.
Rich test fixture support capabilities
6. Portable tester allows you to accurately measure anytime, anywhere
What should I do in the field? Please bring a "wild fox", don't look at it, you can do anything. The Fieldfox N995X Portable RF Microwave Analyzer is an indispensable helper in the field. The following work, it can help you!
7. Signal integrity
Do you know that vector network analyzers can help you complete signal integrity testing?
For the ever-increasing data rate, there are more and more scenarios using the network analyzer as the core combined with the physical layer test software PLTS. Their perfect combination can complete the following test functions. In addition, the flexible multi-port device processing small-energy PXI vector network analyzer combined with PLTS will wipe out more sparks!
For example, a high-speed cable with up to 32 ports, a complete time domain for the backplane, and a conformance test system for frequency domain characteristics. Measuring the total test time of a single Mini-SAS cable takes only a dozen seconds. The main functions of PLTS:
Time domain and frequency domain characteristics of connectors and backplanes
Frequency domain includes return loss, insertion loss, mode conversion, near-end crosstalk, far-end crosstalk, etc.
Time domain includes connectors and cables, impedance of traces, electrical delay, internal delay difference, and inter-delay delay
Eye diagram and eye diagram template test
Conformance testing of time domain and frequency domain, eye diagram indicators
Support COM test and PAM4 eye diagram simulation
Using the automatic fixture removal of the AFR function of the PLTS makes it easy to extract the fixture effect and de-embed it to get the true characteristics of the device under test.
Differential TRL calibration to extract crosstalk effects from differential fixtures for more accurate results
After reading so many dry goods, we know that a good network can really help you get twice the result with half the effort. Of course, a good horse with a good saddle, a good vector can never be separated from a good calibration.
Calibrating the vector network with an electronic calibration kit every day can achieve a similar function to zeroing the electronic scale, so that the vector network analyzer can be used for faster, easier, and more accurate measurements. However, do you care about maintaining it?
Electronic calibration components are fundamentally a very stable device. If the connection, storage and handling methods are correct, the electronic calibration components can be used to achieve guaranteed specifications during the calibration cycle. But extreme environments, excessive input, and incorrect handling can reduce stability and repeatability. Damage to the final connector can significantly affect measurement accuracy.
Heavy ~ point ~ come ~ ~
The reason for these OOTs is that the internal standard of the electronic calibration component has changed, and the other is that the incorrect handling method causes the connector to be damaged.
Internal standard
The characteristics of the electronic calibration component impedance standard are subject to changes due to factors such as aging rate and drift. In order to achieve the performance specifications of the electronic calibration component, the impedance standard component S parameter data stored in the built-in memory of the electronic calibration component must be periodically updated.
Connection method
Defective or damaged connectors can degrade the performance of your electronic calibration and affect the accuracy of your measurements. The figure below shows an example of a good connector with a damaged connector.
To help you diagnose the status of your electronic calibration, prevent the calibration from affecting the accuracy of your measurements. In the upcoming EDICon2018, the Keysight service team will provide you with asset optimization services and training services on site.
The original technician will diagnose the health of the electronic calibration unit on-site, inspect the connector of the calibration piece with the naked eye, with the help of the machine, and with electronic tools, and help clean the connector. Due to limited space, this electronic calibration service is limited to the N4431B model. Customers who have an electronic calibration kit N4431B, please bring your E-Cal calibration kit to the site to obtain professional diagnosis and service from the original Keysight service team.
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